Kafai, Y. B. : rechercher sur Z-Library

Le plus grand référentiel d'articles scientifiques au monde. 70,000,000+ d'articles gratuitement.

Don't use scam websites

Livres
Articles (414)
Les plus populaires
Liste
- Liste
- Tableau

1

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Resist profile simulation with fast lithography model

Lai, Kafai, Erdmann, Andreas, He, Yan-Ying, Chou, Chih-Shiang, Tang, Yu-Po, Huang, Wen-Chun, Liu, Ru-Gun, Gau, Tsai-Sheng

Année:

2014

Langue:

english

Fichier:

PDF, 936 KB

english, 2014

2

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Low-contrast photoresist development model for OPC application at 10nm node

Lai, Kafai, Erdmann, Andreas, Wu, Cheng-En, Wei, David, Zhang, Charlie, Song, Hua

Année:

2015

Langue:

english

Fichier:

PDF, 457 KB

english, 2015

3

Your Second Selves: Player-Designed Avatars

Kafai, Y. B., Fields, D. A., Cook, M. S.

Journal:

Games and Culture

Année:

2010

Langue:

english

Fichier:

PDF, 675 KB

english, 2010

4

Pharmacotherapy for Small Fiber Neuropathy

George, Tikku, Kafaie, Jafar, Huang, Zi Ling, Profirovic, Jasmina

Journal:

Current Treatment Options in Neurology

Année:

2020

Fichier:

PDF, 311 KB

2020

5

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Photoresist 3D profile related etch process simulation and its application to full chip etch compact modeling

Lai, Kafai, Erdmann, Andreas, Wu, Cheng-En, Yang, Wayne, Luan, Lan, Song, Hua

Année:

2015

Langue:

english

Fichier:

PDF, 337 KB

english, 2015

6

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Improving 3D resist profile compact modeling by exploiting 3D resist physical mechanisms

Lai, Kafai, Erdmann, Andreas, Fan, Yongfa, Wu, Cheng-En R., Ren, Qian, Song, Hua, Schmoeller, Thomas

Année:

2014

Langue:

english

Fichier:

PDF, 415 KB

english, 2014

7

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Lithographic process window optimization for mask aligner proximity lithography

Lai, Kafai, Erdmann, Andreas, Voelkel, Reinhard, Vogler, Uwe, Bramati, Arianna, Erdmann, Andreas, Ünal, Nezih, Hofmann, Ulrich, Hennemeyer, Marc, Zoberbier, Ralph, Nguyen, David, Brugger, Juergen

Année:

2014

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2014

8

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Experimental validation of rigorous, 3D profile models for negative-tone develop resists

Lai, Kafai, Erdmann, Andreas, Gao, Weimin, Klostermann, Ulrich, Kamohara, Itaru, Schmoeller, Thomas, Lucas, Kevin, Demmerle, Wolfgang, De Bisschop, Peter, Mailfert, Julien

Année:

2014

Langue:

english

Fichier:

PDF, 960 KB

english, 2014

9

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Immersion and dry scanner extensions for sub-10nm production nodes

Lai, Kafai, Erdmann, Andreas, Weichselbaum, Stefan, Bornebroek, Frank, de Kort, Toine, Droste, Richard, de Graaf, Roelof F., van Ballegoij, Rob, Botter, Herman, McLaren, Matthew G., de Boeij, Wim P.

Année:

2015

Langue:

english

Fichier:

PDF, 7.08 MB

english, 2015

10

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Evaluation of compact models for negative-tone development layers at 20/14nm nodes

Lai, Kafai, Erdmann, Andreas, Chen, Ao, Foong, Yee Mei, Zhang, Dong Qing, Zhang, Hongxin, Chung, Angeline, Fryer, David, Deng, Yunfei, Medvedev, Dmitry, Granik, Yuri

Année:

2015

Langue:

english

Fichier:

PDF, 1.04 MB

english, 2015

11

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Process window enhancement using advanced RET techniques for 20nm contact layer

Lai, Kafai, Erdmann, Andreas, Ping, Yang, McGowan, Sarah, Gong, Ying, Foong, Yee Mei, Liu, Jian, Qiu, Jianhong, Shu, Vincent, Yan, Bo, Ye, Jun, Li, Pengcheng, Zhou, Hui, Pandey, Taksh, Liang, Jiao, Aq

Année:

2014

Langue:

english

Fichier:

PDF, 3.19 MB

english, 2014

12

Application of Dublin Core metadata in the description of digital primary sources in elementary school classrooms

Anne J. Gilliland-Swetland, Yasmin B. Kafai, William E. Landis

Journal:

Journal of the American Society for Information Science and Technology

Année:

2000

Langue:

english

Fichier:

PDF, 80 KB

english, 2000

13

Exploiting sub-20-nm complementary metal-oxide semiconductor technology challenges to design affordable systems-on-chip

Vaidyanathan, Kaushik, Zhu, Qiuling, Liebmann, Lars, Lai, Kafai, Wu, Stephen, Liu, Renzhi, Liu, Yandong, Strojwas, Andzrej, Pileggi, Larry

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Année:

2014

Langue:

english

Fichier:

PDF, 11.78 MB

english, 2014

14

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Modeling the lithography of ion implantation resists on topography

Lai, Kafai, Erdmann, Andreas, Winroth, Gustaf, Vaglio Pret, Alessandro, Ercken, Monique, Robinson, Stewart A., Biafore, John J.

Année:

2014

Langue:

english

Fichier:

PDF, 2.30 MB

english, 2014

15

Electronic Textiles as Disruptive Designs: Supporting and Challenging Maker Activities in Schools

Kafai, Yasmin, Fields, Deborah, Searle, Kristin

Journal:

Harvard Educational Review

Année:

2014

Langue:

english

Fichier:

PDF, 2.18 MB

english, 2014

16

Making more of games: Cultivating perspective-taking through game design

Dishon, Gideon, Kafai, Yasmin B.

Journal:

Computers & Education

Année:

2020

Fichier:

PDF, 1.44 MB

2020

17

Children as designers of educational multimedia software

Yasmin B. Kafai, Cynthia Carter Ching, Sue Marshall

Journal:

Computers & Education

Année:

1997

Langue:

english

Fichier:

PDF, 889 KB

english, 1997

18

Dynamic Bayesian Network for Unconstrained Face Recognition in Surveillance Camera Networks

An, Le, Kafai, Mehran, Bhanu, Bir

Journal:

IEEE Journal on Emerging and Selected Topics in Circuits and Systems

Année:

2013

Langue:

english

Fichier:

PDF, 2.40 MB

english, 2013

19

Reference Face Graph for Face Recognition

Kafai, Mehran, An, Le, Bhanu, Bir

Journal:

IEEE Transactions on Information Forensics and Security

Année:

2014

Langue:

english

Fichier:

PDF, 8.63 MB

english, 2014

20

Design implications of extremely restricted patterning

Vaidyanathan, Kaushik, Liu, Renzhi, Liebmann, Lars, Lai, Kafai, Strojwas, Andzrej J., Pileggi, Larry

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Année:

2014

Langue:

english

Fichier:

PDF, 9.58 MB

english, 2014

21

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Novel wafer stepper with violet LED light source

Lai, Kafai, Erdmann, Andreas, Ting, Yung-Chiang, Shy, Shyi-Long

Année:

2014

Langue:

english

Fichier:

PDF, 226 KB

english, 2014

22

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - An improved virtual aberration model to simulate mask 3D and resist effects

Lai, Kafai, Erdmann, Andreas, Kanaya, Reiji, Fujii, Koichi, Imai, Motokatsu, Matsuyama, Tomoyuki, Tsuzuki, Takao, Lin, Qun Ying

Année:

2015

Langue:

english

Fichier:

PDF, 506 KB

english, 2015

23

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Overlay improvement methods with diffraction based overlay and integrated metrology

Lai, Kafai, Erdmann, Andreas, Nam, Young-Sun, Kim, Sunny, Shin, Ju Hee, Choi, Young Sin, Yun, Sang Ho, Kim, Young Hoon, Shin, Si Woo, Kong, Jeong Heung, Kang, Young Seog, Ha, Hun Hwan

Année:

2015

Langue:

english

Fichier:

PDF, 885 KB

english, 2015

24

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Accurate and fast computation of transmission cross coefficients

Lai, Kafai, Erdmann, Andreas, Apostol, Ştefan, Hurley, Paul, Ionescu, Radu-Cristian

Année:

2015

Langue:

english

Fichier:

PDF, 1.82 MB

english, 2015

25

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - A stochastic approach to SRAF printing prediction

Lai, Kafai, Erdmann, Andreas, Lutich, Andrey

Année:

2014

Langue:

english

Fichier:

PDF, 590 KB

english, 2014

26

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Topographic and other effects on EUV pattern fidelity

Lai, Kafai, Erdmann, Andreas, Sarma, Chandra, Graves, Trey, Neisser, Mark, Robertson, Stewart

Année:

2014

Langue:

english

Fichier:

PDF, 1004 KB

english, 2014

27

From computational thinking to computational participation in K--12 education

Kafai, Yasmin B.

Journal:

Communications of the ACM

Année:

2016

Langue:

english

Fichier:

PDF, 1.52 MB

english, 2016

28

Design technology co-optimization assessment for directed self-assembly-based lithography: design for directed self-assembly or directed self-assembly for design?

Lai, Kafai, Liu, Chi-Chun, Tsai, Hsinyu, Xu, Yongan, Chi, Cheng, Raghunathan, Ananthan, Dhagat, Parul, Hu, Lin, Park, Oseo, Jung, Sunggon, Cho, Wooyong, Morillo, Jaime, Pitera, Jed, Schmidt, Kristin,

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Année:

2017

Langue:

english

Fichier:

PDF, 10.49 MB

english, 2017

29

STEAM Maker Education: Conceal/Reveal of Personal, Artistic and Computational Dimensions in High School Student Projects

Lindberg, Lindsay, Fields, Deborah Ann, Kafai, Yasmin B.

Journal:

Frontiers in Education

Année:

2020

Fichier:

PDF, 2.41 MB

2020

30

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Wafer to wafer overlay control algorithm implementation based on statistics

Lai, Kafai, Erdmann, Andreas, Lee, Byeong Soo, Kang, Young Seog, Kong, Jeong Heung, Hwang, Hyun Woo, Song, Myeong Gyu

Année:

2015

Langue:

english

Fichier:

PDF, 747 KB

english, 2015

31

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Focus shift impacted by mask 3D and comparison between Att. PSM and OMOG

Lai, Kafai, Erdmann, Andreas, Liu, Yansong, Su, Xiaojing, Dong, LiSong, Song, Zhiyang, Guo, Moran, Su, Yajuan, Wei, Yayi

Année:

2015

Langue:

english

Fichier:

PDF, 893 KB

english, 2015

32

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Full-chip model-based OPC verification by using rigorous resist 3D model

Lai, Kafai, Erdmann, Andreas, Kong, Dongho, You, Taejun, Kim, Cheolkyun, Yang, Hyunjo, Yim, Donggyu

Année:

2014

Langue:

english

Fichier:

PDF, 742 KB

english, 2014

33

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Calibrating etch model with SEM contours

Lai, Kafai, Erdmann, Andreas, Weisbuch, François, Omran, A., Jantzen, Kenneth

Année:

2015

Langue:

english

Fichier:

PDF, 1.20 MB

english, 2015

34

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Comparing the experimental resist image with aerial image intensity in high-NA projection lense

Lai, Kafai, Erdmann, Andreas, Shibuya, Masato, Takada, Akira, Nakashima, Toshiharu

Année:

2015

Langue:

english

Fichier:

PDF, 611 KB

english, 2015

35

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Investigating deprotection-induced shrinkage and retro-grade sidewalls in NTD resists

Lai, Kafai, Erdmann, Andreas, Pistor, Thomas V., Wang, Chenchen, Wang, Yan, Yuan, Lei, Kye, Jongwook, Wu, Yixu, Mehta, Sohan, Ackmann, Paul

Année:

2015

Langue:

english

Fichier:

PDF, 1.20 MB

english, 2015

36

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Rigorous wafer topography simulation for investigating wafer alignment quality and robustness

Lai, Kafai, Erdmann, Andreas, Morgana, Nicoló, Gavrilin, Dmitrii, Greiner, Andreas, Hofmann, Detlef, Kamohara, Itaru, Klostermann, Ulrich, Moeller, Holger, Preuninger, Juergen

Année:

2015

Langue:

english

Fichier:

PDF, 12.71 MB

english, 2015

37

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - The study of lithography conditions to use advanced resist performance properly

Lai, Kafai, Erdmann, Andreas, Yang, Zhengkai, Wang, Wuping, Chen, Quan, Aoyama, Hajime, Takemasa, Kengo, Sei, Toshihiko, Miyazawa, Tami, Matsuyama, Tomoyuki, Shao, Chun

Année:

2015

Langue:

english

Fichier:

PDF, 1004 KB

english, 2015

38

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Optical Microlithography XXVIII - Double-sided diffractive photo-mask for sub-500nm resolution proximity i-line mask-aligner lithography

Lai, Kafai, Erdmann, Andreas, Bourgin, Yannick, Siefke, Thomas, Käsebier, Thomas, Kley, Ernst-Bernhard, Zeitner, Uwe D.

Année:

2015

Langue:

english

Fichier:

PDF, 1.11 MB

english, 2015

39

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Hybrid OPC modeling with SEM contour technique for 10nm node process

Lai, Kafai, Erdmann, Andreas, Hitomi, Keiichiro, Halle, Scott, Miller, Marshal, Graur, Ioana, Saulnier, Nicole, Dunn, Derren, Okai, Nobuhiro, Hotta, Shoji, Yamaguchi, Atsuko, Komuro, Hitoshi, Ishimoto

Année:

2014

Langue:

english

Fichier:

PDF, 867 KB

english, 2014

40

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California (Monday 19 September 2011)] Photomask Technology 2011 - Total source mask optimization: high-capacity, resist modeling, and production-ready mask solution

Fakhry, Moutaz, Maurer, Wilhelm, Abboud, Frank E., Granik, Yuri, Adam, Kostas, Lai, Kafai

Année:

2011

Langue:

english

Fichier:

PDF, 1.79 MB

english, 2011

41

Rickettsia Sca4 Reduces Vinculin-Mediated Intercellular Tension to Promote Spread

Lamason, Rebecca L., Bastounis, Effie, Kafai, Natasha M., Serrano, Ricardo, del Álamo, Juan C., Theriot, Julie A., Welch, Matthew D.

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 6.23 MB

english, 2016

42

The contribution of leg press and knee extension strength and power to physical function in people with knee osteoarthritis: A cross-sectional study

Tevald, Michael A, Murray, Amanda M, Luc, Brittney, Lai, Kafai, Sohn, David, Pietrosimone, Brian

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 302 KB

english, 2016

43

Building a Home for the Maker Movement

Kafai, Yasmin B.

Journal:

Journal of Digital Learning in Teacher Education

Année:

2018

Langue:

english

Fichier:

PDF, 327 KB

english, 2018

44

Constructionist visions: Hard fun with serious games

Kafai, Yasmin B.

Journal:

International Journal of Child-Computer Interaction

Année:

2018

Langue:

english

Fichier:

PDF, 146 KB

english, 2018

45

The ethics of play and participation in a tween virtual world: Continuity and change in cheating practices and perspectives in the Whyville community

Kafai, Yasmin B., Fields, Deborah A., Ellis, Estee

Journal:

Cognitive Development

Année:

2019

Langue:

english

Fichier:

PDF, 778 KB

english, 2019

46

Glycemic load is associated with HDL cholesterol but not with the other components and prevalence of metabolic syndrome in the third National Health and Nutrition Examination Survey, 1988–1994

Amy Culberson, Mohammad R Kafai, Vijay Ganji

Journal:

International Archives of Medicine

Année:

2009

Langue:

english

Fichier:

PDF, 177 KB

english, 2009

47

A connective ethnography of peer knowledge sharing and diffusion in a tween virtual world

Deborah A. Fields, Yasmin B. Kafai

Journal:

International Journal of Computer-Supported Collaborative Learning

Année:

2009

Langue:

english

Fichier:

PDF, 314 KB

english, 2009

48

Game Design as an Interactive Learning Environment for Fostering Students' and Teachers' Mathematical Inquiry

Y.B. Kafai, M.L. Franke, C.C. Ching, J.C. Shih

Journal:

Technology, Knowledge and Learning

Année:

1998

Langue:

english

Fichier:

PDF, 231 KB

english, 1998

49

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, CA (Sunday 22 February 2009)] Optical Microlithography XXII - Intensive optimization of masks and sources for 22nm lithography

Rosenbluth, Alan E., Melville, David O., Tian, Kehan, Bagheri, Saeed, Tirapu-Azpiroz, Jaione, Lai, Kafai, Waechter, Andreas, Inoue, Tadanobu, Ladanyi, Laszlo, Barahona, Francisco, Scheinberg, Katya, S

Année:

2009

Langue:

english

Fichier:

PDF, 1.45 MB

english, 2009

50

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Optical Microlithography XVII - New paradigm in lens metrology for lithographic scanner: evaluation and exploration

Lai, Kafai, Gallatin, Gregg M., van de Kerkhof, Mark A., de Boeij, Wim, Kok, Haico, Schriever, Martin, Morillo, Jaime D., Fair, Robert H., Bennett, Stephanie, Corliss, Daniel A., Smith, Bruce W.

Année:

2004

Langue:

english

Fichier:

PDF, 294 KB

english, 2004